silicon wafers造句

• The processing characteristics and some material properties of silicon wafers depend on the orientation .
  硅片的工艺性质与某些材料特性均与晶向有关。
• The final ic is made by sequentially transferring the features from each mask, level by level, to the surface of the silicon wafer .
  按照顺序从每一块掩膜版上将图形一层一层地转移到硅片的表面，就制得了成品集成电路。
• Lithography, as used in the manufacture of ics, is the process of transferring geometic shapes on a mask to the surface of a silicon wafer .
  光刻技术应用到集成电路制造中，就是将掩模版的几何图形转移到硅片表面的工艺过程。
• Visual inspection for silicon wafers with specular surfaces
  镜面硅片的目视检查
• Visual inspection for sliced and lapped silicon wafers
  切制硅片及磨光硅片的目视检查
• Hot plate with silicon wafer lowered to heating position
  加热板与矽晶圆降低至加热位置。
• Afm investigations of process of cu thin films deposited on silicon wafers
  基上沉积成核的演化过程
• Mechanical test wafer - a silicon wafer used for testing purposes
  机械测试晶圆片-用于测试的晶圆片。
• On the other hand , is a silicon wafer that a core resides on
  而芯片（ chip ）是将核心封装起来的一块硅片。
• Hot plate with silicon wafer in initial configuration ( before heating )
  加热板与矽晶圆在启始状态（加热前） 。
• Self - assembly of silica photonic crystals inside micro - channel on silicon wafer
  硅槽内自组装二氧化硅光子晶体
• Contamination particulate - particles found on the surface of a silicon wafer
  沾污颗粒-晶圆片表面上的颗粒。
• Contamination particulate - particles found on the surface of a silicon wafer
  沾污颗粒-晶的上面表片圆颗粒。
• Test method for detection of oxidation induced defects in polished silicon wafers
  硅抛光片氧化诱生缺陷的检验方法
• Effect of substrate orientation on microstructure of hydrogen - implanted silicon wafers
  面向对注氢硅片中微结构的影响
• Methods of measurement of thickness , thickness variation and bow for silicon wafer
  硅片厚度厚度变化及弯曲的测量方法
• Test method for measuring resistivity of silicon wafers using spreading resistance probe
  硅片电阻率测定扩展电阻探针法
• An improved angle polishing method for measuring subsurface damage in silicon wafers
  一种改进的测量硅片亚表面损伤的角度抛光方法
• Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
  用四点探针法对硅晶体和硅片电阻率的测试方法
• Test wafer - a silicon wafer that is used in manufacturing for monitoring and testing purposes
  测试晶圆片-用于生产中监测和测试的晶圆片。